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Document Standardization Division
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Test Method Standard Test Methods for Semiconductor Devices
FSC 5961
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices. As a convenience to users interested in the content of the next revision of MIL-STD-750, a working draft folder has been established. For access go to
750_Work_Draft.
Points of contact:
- Semiconductor Group
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Phone: 614-692-7106, 7078
Email: Semiconductor@dla.mil
Document Downloads
- MIL-STD-750
- Test Method Standard Test Methods for Semiconductor Devices
Revision: E,
Dated: 20 November 2006
File name: std750.pdf, File size: 9854 kb
- MIL-STD-750 Extension of Implementation Letter
- Extension of Implementation Date of MIL-STD-750, Test Method 1071.8.
Dated: 8 February 2008
File name: std750TM1071.8Letter.PDF, File size: 41 kb
- MIL-STD-750 Main Body
- MIL-STD-750 Main Body
Dated: 20 November 2006
File name: std750_mainbody.pdf, File size: 433 kb
- MIL-STD-750E Change Summary
- Summary of Changes for MIL-STD-750, Revision E.
Dated: 18 April 2007
File name: std750ChangeSumm.pdf, File size: 118 kb
- MIL-STD-750 1000 Series Tests
- 1000 Series Environmental Tests
Dated: 20 November 2006
File name: std750_1000.pdf, File size: 1548 kb
- MIL-STD-750 2000 Series Tests
- 2000 Series Mechanical Characteristics Tests
Dated: 20 November 2006
File name: std750_2000.pdf, File size: 6388 kb
- MIL-STD-750 3000 Series Tests
- 3000 Series Electrical Characteristics Tests for Bipolar Transistors
Dated: 20 November 2006
File name: std750_3000.pdf, File size: 3183 kb
- MIL-STD-750 4000 Series Tests
- 4000 Series Electrical Characteristics Tests for Diodes
Dated: 20 November 2006
File name: std750_4000.pdf, File size: 793 kb
- MIL-STD-750 5000 Class
- 5000 Class High Reliability Space Application Tests
Dated: 20 November 2006
File name: std750_5000.pdf, File size: 158 kb
Related Items
- MIL-HDBK-6100
- Military Handbook, List Of Case Outlines And Dimensions For Discrete Semiconductor Devices
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